Jpn. J. Appl. Phys. 19 (1980) Supplement 19-3 pp. 33-41  |Previous Article| |Next Article|  |Table of Contents|
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4th Int. Conf. Ternary and Multinary Compounds, Tokyo, 1980

Preparation and Some Properties of CuInSe2 on ZnSe Heterojunction Grown by LPE

Hiroshi Takenoshita, Tanehiro Nakau and Itiro Nakao

Department of Electronics, College of Engineering, University of Osaka Prefecture, Mozu, Sakai, Osaka 591, Japan

CuInSe2 has been grown on ZnSe by LPE from the Bi solution. The value of lattice mismatch is 2.06%. The reflection electron diffraction pattern showed an epitaxial growth. Optimum growth condition was the following: maximum temperature of 600°C, cooling rate of 0.5°C/min, thickness of the over-growth layer of 6 µm and thickness of mixed crystal layer of 4.5 µm. The flatness of overgrowth surface was dependent on the substrate orientation and the quality was in order of (111)Se, (100), (111)zn and (110). Hall measurements on over-growth layer were carried out after the heat-treatment in Se and Zn atmosphere for 10 minutes at 600°C. The p·CuInSe2–n·ZnSe and n·CuInSe2–n·ZnSe heterodiodes were measured for their IV, CV characteristics and photoresponse. Especially, the n-n heterodiode showed a high photosensitivity.

URL: http://jjap.jsap.jp/link?JJAPS/19S3/33/


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