Jpn. J. Appl. Phys. 26 (1987) Supplement 26-3-1 pp. 257-258  |Previous Article| |Next Article|  |Table of Contents|
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Proc. 18th Int. Conf. Low Temperature Physics, Kyoto, 1987

Reflection of ⁴He Atomic Beams from Films of Superfluid ⁴He on Glass and Mica

S. Mukherjee, D. Candela, D. O. Edwards and S. Kumar

We have measured the reflection coefficient of ⁴He atoms from films of super fluid ⁴He on glass and mica. The measurements were made as a function of the momentum of the atoms and the film thickness. We observed specular reflection from the glass substrate only for a thick (232Å) film, and from the mica for both a thin (34Å) and a thick (232Å) film. No inelastic scattering is observed. The thin film has a much smaller reflection coefficient than the thick film.

URL: http://jjap.jsap.jp/link?JJAPS/26S3/257/